Advances in Scanning Probe Microscopy by Naruo Sasaki, Masaru Tsukada (auth.), Professor Toshio

By Naruo Sasaki, Masaru Tsukada (auth.), Professor Toshio Sakurai, Professor Yousuke Watanabe (eds.)

This booklet covers a number of of crucial subject matters of present curiosity within the vanguard of scanning probe microscopy. those contain a pragmatic thought of atom-resolving atomic strength microscopy (AFM), basics of MBE development of III-V compound semiconductors and atomic manipulation for destiny single-electron devices.

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These ab initio pseudopotentials are capable of describing the scattering due to the true ion cores in a variety of atomic environments. Ab initio pseudopotential techniques are widely applied to study electronic structures and dynamical properties of a variety of materials, especially semiconductors, as will be described in Sects. 4. 3 Surface Structures The surface of a solid no longer has the three-dimensional periodicity of the crystal and surface atoms relax from what would be their ideal bulk positions.

15a- c. 50 N/m. 75 N/ m, respectively. As seen in these force images, Fig. 15b resembles Fig. 15c more closely than Fig. 15a. This feature is quantitatively examined in the cross sections of Figs. 15a- c at the line indicated by the thick arrow along the y direction. In Fig. 16, the lateral force curve with 20 N. Sasaki and M. Tsukada [t] Fig. 15. Comparison of lateral force Fy(xs, Ys) images for elastic and rigid surfaces. 75 N/m. 75 N/m (rigid) Fig. 16. The cross sections of Fig. 15 at the line indicated by the arrow along the y direction.

T. R Albrecht, P. Grutter, D. Horne and D. Rugar, J. App!. Phys. 69, 668 (1991). 5. Q. Zhong, D. Inniss and V. B. Elings, Surf. Sci. 290, L688 (1993). 6. C. M. Mate, G. M. McClelland, R Erlandsson and S. Chiang, Phys. Rev. Lett. 59, 1942 (1987). 7. J. Bardeen, Phys. Rev. Lett. 15, 57 (1961). 8. N. Sasaki and M. Tsukada, Phys. Rev. B 52, 8471 (1995); Jpn. J. App!. Phys. 34, 3319 (1995). 9. F. J. Giessibl, Science 267, 67 (1995). 10. S. Kitamura and M. Iwatsuki, Jpn. J. App!. Phys. 34, L145 (1995).

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